The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Dec. 18, 2009
Dennis P. Sarr, Kent, WA (US);
James C. Kennedy, Renton, WA (US);
Hien T. Bui, Renton, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A nondestructive inspection apparatus and method for inspecting a structure having an interior opening portion may comprise an inspection apparatus outer probe unit having a plurality of outer probe unit walls each having a surface corresponding to a respective one of the plurality of exterior surfaces of a respective structure wall, the outer probe unit may comprise a first outer probe member and a second outer probe member, magnetically coupled to each other through magnetic attraction between a magnet on the first outer probe unit member and a magnet on the second outer probe unit member; and a magnetic balance positioned to force the second outer probe unit member in a direction of increased magnetic coupling of the second outer probe unit member to the first outer probe unit member through magnetic repulsion between a magnet on the magnetic balance and a magnet on the second outer probe unit member.