The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
May. 18, 2011
Applicant:
Wayne Tseng, Taipei Hsien, TW;
Inventor:
Wayne Tseng, Taipei Hsien, TW;
Assignee:
Via Technologies Inc., Taipei Hsien, TW;
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 7/02 (2006.01); G01R 31/28 (2006.01); G01R 31/30 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A built-in self test circuit includes a pattern generator, an elastic buffer, a symbol detector, and a comparison unit. A pattern generator generates a first test pattern to test a port under test and then a result pattern is gotten and stored in the elastic buffer. The symbol detector detects if a starting symbol exists in the test result pattern. If it exists, a second test pattern is generated to be compared with the test result pattern. As a result, a reliability of data transmission of the port under test is determined.