The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Jan. 12, 2010
Applicants:

Yong Wang, Beijing, CN;

Xiaolong HU, Beijing, CN;

Yiquan Yang, Beijing, CN;

Inventors:

Yong Wang, Beijing, CN;

Xiaolong Hu, Beijing, CN;

Yiquan Yang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a topology collection method and dual control board device applicable to a stacking system comprising dual control board devices. A master control board of a dual control board device advertises through a stack port the topology information of the member device in which the master control board resides, including information about the master control board and, if a slave control board is present, information about the slave control board; and stores the topology information or updates the existing topology information upon receiving the topology information of the stacking system through the stack port, and backs up the stored topology information of the stacking system to the slave control board after the slave control board is inserted. This invention is applicable for collecting the topology information of a stacking system comprising distributed dual control board devices.


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