The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Dec. 23, 2009
Applicants:

Hsin-te Wang, HsinChu, TW;

Wen-ben Wang, HsinChu, TW;

Inventors:

Hsin-Te Wang, HsinChu, TW;

Wen-Ben Wang, HsinChu, TW;

Assignee:

Altek Corporation, HsinChu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of numerical analysis for continuous data includes: providing a temporary storage block, fetching a plurality of data units sequentially from continuous data to store in the temporary storage block, conducting an analysis step wherein each data unit is analyzed sequentially based on all the data units stored in the temporary storage block, recording the analysis result, performing an OR operation on the analysis result of each of the data units and the corresponding previous analysis result, and determining whether the end of the continuous data has been reached. If so, the method terminates. If not, the first of the data units is removed, the next data unit from the continuous data is fetched, and the analysis step is returned to. The method can be implemented in hardware with less temporary storage space and read/write overheads. A system of numerical analysis for continuous data is also provided.


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