The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Apr. 26, 2007
Neal R. Myerson, Seattle, WA (US);
Darren C. Justus, New York, NY (US);
Jitendra Luniya, Pune, IN;
Carroll W. Moon, Altavista, VA (US);
Susan Pallini, Windham, NH (US);
Neal R. Myerson, Seattle, WA (US);
Darren C. Justus, New York, NY (US);
Jitendra Luniya, Pune, IN;
Carroll W. Moon, Altavista, VA (US);
Susan Pallini, Windham, NH (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A metrics generation system provides IT and other computing system metrics from different data sources in a single display. Configuration files containing parameters and instructions are loaded by the system to access different data sources. The metrics generation system retrieves IT system health data, processes and aggregates metrics from the retrieved data and displays the metrics based on user defined parameters and instructions in the configuration files. The metrics generation system is flexible in that it can be changed to extract data from different IT data sources, calculate different metric information having a hierarchy of attribute types and values, and display a variety of metric data in different formats.