The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Nov. 07, 2002
James A. Grey, Cedar Park, TX (US);
Daniel Elizalde, Austin, TX (US);
James A. Grey, Cedar Park, TX (US);
Daniel Elizalde, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for performing a multiple tests on each of one or more units, where each of the tests requires a respective resource of a plurality of resources. A first test is performed on a unit using a first resource. During performance of the first test, a search is made for a second test, requiring a second resource, where the second resource is not currently being used. If the second test is found, the second test is performed on the unit, or a second unit, using the second resource, substantially concurrently with at least a portion of the first test being performed on the unit. Performing a test includes locking the respective resource to exclude use by other tests, including acquiring the resource, and unlocking the resource upon completion of the test, including releasing the resource for use in performing the respective test on another of the units.