The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Nov. 19, 2004
Alan Joe Wysuph, Round Rock, TX (US);
Michael George Ott, Austin, TX (US);
Bruce Hubert Campney, Pflugerville, TX (US);
Cindy Alsup Scott, Georgetown, TX (US);
Michael Wayne Ausen, Round Rock, TX (US);
Gary Keith Law, Georgetown, TX (US);
Godfrey Roland Sherriff, Austin, TX (US);
David Mark Smith, Round Rock, TX (US);
Julian Kevin Naidoo, Cedar Park, TX (US);
Alan Joe Wysuph, Round Rock, TX (US);
Michael George Ott, Austin, TX (US);
Bruce Hubert Campney, Pflugerville, TX (US);
Cindy Alsup Scott, Georgetown, TX (US);
Michael Wayne Ausen, Round Rock, TX (US);
Gary Keith Law, Georgetown, TX (US);
Godfrey Roland Sherriff, Austin, TX (US);
David Mark Smith, Round Rock, TX (US);
Julian Kevin Naidoo, Cedar Park, TX (US);
Fisher-Rosemount Systems, Inc., Round Rock, TX (US);
Abstract
Secure data write apparatus and methods for use in safety instrumented process control systems select a parameter associated with a process control element within the process control system and send first data associated with the parameter to the process control element. A confirmation associated with a request to write the first data to the process control element is received from a user and the second data is sent to the process control element in response to receiving the confirmation. The first and second data are compared at the process control element and the first or second data are written to a location in the process control element associated with the parameter if the first and second data are at least substantially identical.