The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Aug. 11, 2008
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Stefan Popescu, Erlangen, DE;
Rainer Raupach, Heroldsbach, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Stefan Popescu, Erlangen, DE;
Rainer Raupach, Heroldsbach, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is disclosed for marking and visualizing an implant by use of an x-ray phase-contrast tomography examination. Further, an implant is also disclosed. In at least one embodiment, implants are used with specific characteristics which are as unambiguous as possible with regard to the phase shift generated by the implants in a phase-contrast tomography examination. In at least one embodiment, these specific characteristics can include the typical self-generated specific phase shift, typical differences in the specific phase-shift values, or typical spatial structures of materials with well-defined phase-shift values.