The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Apr. 28, 2008
Yasuyuki Matsushita, Beijing, CN;
Stephen Ssu-te Lin, Beijing, CN;
Yasuyuki Matsushita, Beijing, CN;
Stephen Ssu-te Lin, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
Technologies for comparing observed intensities using a probabilistic similarity measure. In the probabilistic similarity measure example, there is no attempt to estimate a true intensity. Rather, the similarity of two observed intensities is defined as the likelihood that they each resulted from the same but unknown true identity while taking into account the noise characteristics of the camera observing the intensities. Since the true intensity is unknown, all possible true intensities are taken into account, rather than using a specific true intensity estimate. The probabilistic similarity measure indicates the degree to which two intensities correspond to the same intensity without estimating a true scene intensity value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile