The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

May. 01, 2009
Applicants:

Chen Chang, Taipei, TW;

Chien-yuan Lin, Taipei, TW;

Jyh-horng Chen, Taipei, TW;

Inventors:

Chen Chang, Taipei, TW;

Chien-Yuan Lin, Taipei, TW;

Jyh-Horng Chen, Taipei, TW;

Assignee:

Academia Sinica, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method comprises performing a first T2-weighted imaging (T2WI) on a subject; injecting the subject with a contrast agent after performing the first T2WI; and waiting a predetermined period of time before performing a second T2WI on the subject. The first T2WI and second T2WI are then co-registered. The co-registered first T2WI and co-registered second T2WI are then trimmed. A ΔRmap is then determined based on each pixel of the trimmed first T2WI and corresponding pixels of the trimmed second T2WI. A three-dimensional map is constructed based on the ΔRmap.


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