The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Dec. 01, 2009
Applicant:

Takashi Nakatsukasa, Osaka, JP;

Inventor:

Takashi Nakatsukasa, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image of a measurement object is displayed, and specification of a feature image and a measurement position is received on the displayed image. The feature image, the specification has been received, and information on relative positions for the feature image, which represents the measurement position and a display position of a dimension line, are stored. A newly acquired image of the measurement object is compared with the feature image to identify information on the attitude and the position of the image of the measurement object. A measurement position is set for the image of the measurement object with the identified attitude and position, and then predetermined physical quantities are measured. Based on the stored information on the relative position for the feature image displaying the dimension line, a dimension line indicating a measurement position and a measurement result are displayed at predetermined positions.


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