The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Aug. 15, 2008
Applicants:

Gary Gibson, Sedgefield, GB;

Max Robinson, Shincliffe, GB;

Inventors:

Gary Gibson, Sedgefield, GB;

Max Robinson, Shincliffe, GB;

Assignee:

Kromek Limited, Durham, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of and apparatus for obtaining radiation interaction data related to an image of an object. The method involves using a detector system for detecting and collecting spectroscopically resolvable information about incident radiation, and collecting one or more datasets of information at the detector after interaction with an object. Each dataset is resolved across at least three frequency bands within the spectrum of the source. The ratio between measured intensities is evaluated for at least two pairs of such frequency bands in a given intensity dataset to obtain a numerical indicator in functional relationship with a material property. The numerical indicator is then compared with a library of data characteristics of target materials. An apparatus is also disclosed for inspection of materials.


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