The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Dec. 04, 2007
Liyan Yin, Shenzhen, CN;
Liyan Yin, Shenzhen, CN;
Huawei Technologies Co., Ltd., Shenzhen, CN;
Abstract
The invention provides a method and an element for determining a measurement time of an inter-frequency measurement, used for the dual mode UE supporting FDD mode and TDD mode in the FDD mode to perform the inter-frequency measurement to the TDD cell. If a whole timeslot is found within the measurement time, the PCCPCH mapped from the broadcast channel bearing the system information being located in the timeslot, the measurement time is taken as the valid measurement time for measuring the measurement performance. Accordingly, a method for measuring inter-frequency is also provided. A credible valid measurement time and a credible inter-frequency measurement may be realized according to the invention. Thus, the accuracy for evaluating the measurement performance and the measurement accuracy may be improved.