The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Mar. 09, 2010
Kiyotaka Ito, Hyogo, JP;
Mamoru Shoji, Osaka, JP;
Yasumori Hino, Nara, JP;
Atsushi Nakamura, Osaka, JP;
Naoyasu Miyagawa, Hyogo, JP;
Motoshi Ito, Osaka, JP;
Kiyotaka Ito, Hyogo, JP;
Mamoru Shoji, Osaka, JP;
Yasumori Hino, Nara, JP;
Atsushi Nakamura, Osaka, JP;
Naoyasu Miyagawa, Hyogo, JP;
Motoshi Ito, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
The present invention provides a measure for getting read/write control information stored within a space of a predetermined size in a format that ensures compatibility with media of a lower order or an older generation even if the size of the read/write control information increases significantly as the storage densities of information storage media rise in the near future. On an information storage medium, a data sequence is writable as a combination of marks and spaces. The medium has at least one information storage layer, which has an information storage area to store information and a control information area for use to perform a read/write operation on the at least one information storage layer. The control information area stores at least one set of control information, which includes a first kind of write pulse information including information to be used as a reference value and a second kind of write pulse information including information to be used as an offset value. The size of the offset value is at least a half as large as that of the reference value.