The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Aug. 26, 2011
Stewart A. Levin, Centennial, CO (US);
Stewart A. Levin, Centennial, CO (US);
Landmark Graphics Corporation, Houston, TX (US);
Abstract
A system and method for locating subsurface diffractors. The method operates on two-dimensional (2-D) seismic data that includes one or more 2-D seismic lines. The 2-D seismic data may be preprocessed to enhance diffracted energy. For each hypothetical diffractor location in a set of hypothetical diffractor locations, the method involves analyzing at least a subset of the seismic traces of the one or more 2-D seismic lines, in order to compute a value indicating an extent to which those seismic traces contain diffraction arrivals consistent with the hypothetical diffractor location. The method may further involve generating, storing and displaying an image (or map) based on the computed values. The image may illustrate areas of high, intermediate and low diffraction, and may be used to assess the formation.