The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Jan. 23, 2008
Heikki Saari, Espoo, FI;
Heikki Saari, Espoo, FI;
Valtion Teknillinen Tutkimuskeskus, Espoo, FI;
Abstract
The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source () formed by multiple single radiation sources () having different central wavelengths, for generating a measuring signal, a measurement object () containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter () for the band pass filtering the measuring signal by at least two pass bands, and a detector () for detecting said filtered measuring signals received from the measurement object (). The spectrometer has: means () for modulating each of the single radiation sources () and correspondingly means () for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (); and means for detecting () and demodulating () multiple pass hands simultaneously.