The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Jun. 05, 2009
Applicants:

Teik Wah Lim, Bayan Lepas, MY;

Eng Huat Lee, Ayer Itam, MY;

IE Chen Chia, Sitiawan, MY;

Thow Pang Chong, Sungai Ara, MY;

Boon Jin Ang, Butterworth, MY;

Kim Pin Tan, Bayan Lepas, MY;

Inventors:

Teik Wah Lim, Bayan Lepas, MY;

Eng Huat Lee, Ayer Itam, MY;

Ie Chen Chia, Sitiawan, MY;

Thow Pang Chong, Sungai Ara, MY;

Boon Jin Ang, Butterworth, MY;

Kim Pin Tan, Bayan Lepas, MY;

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Circuits and a method for tuning an integrated circuit (IC) are disclosed. The IC includes multiple programmable fuses coupled to a control block. The programmable fuses used may be one-time programmable (OTP) fuses. The control block reads settings or data stored in the programmable fuses. A tuning circuit coupled to the control block receives the delay transmitted by the control block. The tuning circuit allows tuning of the IC without changes to the fabrication mask. The tuning circuit may include delay chains to provide additional delay to the IC when needed and the delay in the tuning circuit is configured based on the delay value stored in the programmable fuses and transmitted by the control block.


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