The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Jun. 30, 2011
Applicants:

Nilesh Tralshawala, Rexford, NY (US);

Thomas Alan Early, Clifton Park, NY (US);

William Thomas Dixon, Clifton Park, NY (US);

Waseem Ibrahim Faidi, Schenectady, NY (US);

Thomas Miebach, Ballston Spa, NY (US);

Inventors:

Nilesh Tralshawala, Rexford, NY (US);

Thomas Alan Early, Clifton Park, NY (US);

William Thomas Dixon, Clifton Park, NY (US);

Waseem Ibrahim Faidi, Schenectady, NY (US);

Thomas Miebach, Ballston Spa, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Structural health monitoring using nuclear quadrupole resonance is disclosed. For example, in one embodiment, a method of monitoring stress is provided. The method includes scanning a composite using an NQR spectrometer, the composite having a polymer matrix and a microcrystalline material disposed in the matrix. The microcrystalline material includes molecules having nuclei with respective nuclear quadrupole moments. The method also includes determining microscopic strain distribution indices of the composite from the NQR scans to quantify stress and identify precursors to failure in the composite.


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