The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Apr. 16, 2007
Applicants:

Isao Kezobo, Tokyo, JP;

Masahiro Kimata, Tokyo, JP;

Takayuki Kifuku, Tokyo, JP;

Kazumichi Tsutsumi, Tokyo, JP;

Chiaki Fujimoto, Tokyo, JP;

Noriyuki Inoue, Tokyo, JP;

Inventors:

Isao Kezobo, Tokyo, JP;

Masahiro Kimata, Tokyo, JP;

Takayuki Kifuku, Tokyo, JP;

Kazumichi Tsutsumi, Tokyo, JP;

Chiaki Fujimoto, Tokyo, JP;

Noriyuki Inoue, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02P 6/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electric motor control apparatus that can quickly and accurately locate a short-circuit fault point. The electric motor control apparatus includes: a current controller determining respective phase voltage commands according to currents flowing in respective phases of an electric motor and a torque current command; a switching element drive circuit instructing, based on the respective phase voltage commands, an inverter to perform a switching operation; the inverter receiving a switching operation signal to drive the electric motor; current detectors disposed in series with the switching elements in the respective phases of the inverter; and a short-circuit point locating mechanism storing a test pattern indicative of a predetermined combination for turning on the switching elements of the inverter, and locating a short-circuit fault point based on the test pattern and current detection values in the respective phases detected by the current detectors in response to the test pattern.


Find Patent Forward Citations

Loading…