The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Feb. 01, 2008
Applicants:

Andreas Hofmann, Wallenfels, DE;

Norbert Danz, Jena, DE;

Silke Hofmann, Wallenfels, DE;

Michael Keusgen, Marburg/Lahn, DE;

Ulla Magdolen, Kirchheim, DE;

Inventors:

Andreas Hofmann, Wallenfels, DE;

Norbert Danz, Jena, DE;

Silke Hofmann, Wallenfels, DE;

Michael Keusgen, Marburg/Lahn, DE;

Ulla Magdolen, Kirchheim, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for examining an attachment or detachment of living cells, dead cells or cell-like particles on a surface using plasmon resonance includes irradiating a measurement region with beams over the entire angle of incidence spectrum and capturing, combining and evaluating beams with identical angles of incidence reflected from different points of the measurement region with a determination of the angle of light incidence with a lowest reflected light intensity and measuring an angle of incidence shift of an intensity minimum that occurs. The evaluating includes registering different angles of incidence of two or more intensity minima occurring simultaneously to reflect a respective level of the surface accumulations.


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