The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Apr. 29, 2005
Lawrence Jason Berger, New York, NY (US);
Anouk Markovits, New York, NY (US);
Susan Kare, San Francisco, CA (US);
David Barratt Stevenson, New York, NY (US);
Justine Elizabeth Roberts, Brooklyn, NY (US);
Lawrence Jason Berger, New York, NY (US);
Anouk Markovits, New York, NY (US);
Susan Kare, San Francisco, CA (US);
David Barratt Stevenson, New York, NY (US);
Justine Elizabeth Roberts, Brooklyn, NY (US);
Wireless Generation, Inc., New York, NY (US);
Abstract
A real-time observation assessment system includes an assessment application that enables an assessor to administer a probe to a student, and to capture responses of the student, and to automatically score the captured responses. The assessment system includes a user interface of the assessment application. The user interface includes a first area of the user interface that displays a character sequence that is divided into multiple segments, where at least two of the multiple segments of the character sequence are separately selectable and a second area of the user interface that is divided into multiple segments corresponding to each segment of the character sequence in the first area, where each segment in the second area is separately selectable to enable capturing of different combinations of student responses reflecting selection of one or more of the segments in the second area. A scoring module enables a score to be calculated based on the selected segments according to scoring rules for the probe.