The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2012
Filed:
Jul. 07, 2009
John Jy-an Wang, Oak Ridge, TN (US);
Ken C. Liu, Oak Ridge, TN (US);
Zhili Feng, Knoxville, TN (US);
John Jy-an Wang, Oak Ridge, TN (US);
Ken C. Liu, Oak Ridge, TN (US);
Zhili Feng, Knoxville, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
A stress-strain testing apparatus imposes a stress-strain on a specimen while disposed in a controlled environment. Each end of the specimen is fastened to an end cap and a strain gage is attached to the specimen. An adjusting mechanism and a compression element are disposed between the end caps forming a frame for applying forces to the end caps and thereby stress-straining the specimen. The adjusting mechanism may be extended or retracted to increase or decrease the imposed stress-strain on the specimen, and the stress-strain is measured by the strain gage on the specimen while the apparatus is exposed to an environment such as high pressure hydrogen. Strain gages may be placed on the frame to measure stress-strains in the frame that may be caused by the environment.