The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2012

Filed:

Apr. 13, 2009
Applicants:

Takahiro Suita, Tokyo, JP;

Keisuke Kawahara, Tokyo, JP;

Inventors:

Takahiro Suita, Tokyo, JP;

Keisuke Kawahara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/00 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an ultrasonograph and the like capable of easily specifying defective parts of an ultrasound probe and appropriately treating the defective parts. A test method of an operation of an ultrasound probe that transmits and receives a signal of ultrasound for creating a diagnostic image in an ultrasonograph includes: bringing a test material into contact with the ultrasound probe and transmitting a first ultrasound from the ultrasound probe to the test material by a first transmitting circuit connected to the ultrasound probe; receiving, by a first receiving circuit connected to the ultrasound probe, a received signal of a reflected wave of the first ultrasound received by the test material and receiving, by a second receiving circuit connected to the test material, a received signal of the first ultrasound received by the test material; and comparing the received signals with each normal received signal stored in a memory and determining whether the operation of the ultrasound probe is normal or defective based on the comparison result.


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