The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Sep. 30, 2007
William Y. Chen, Los Altos, CA (US);
Jiwei LU, Pleasanton, CA (US);
Geetha K. Vallabhaneni, Fremont, CA (US);
William Y. Chen, Los Altos, CA (US);
Jiwei Lu, Pleasanton, CA (US);
Geetha K. Vallabhaneni, Fremont, CA (US);
Oracle America, Inc., Redwood City, CA (US);
Abstract
A method for testing and debugging of dynamic binary translation wherein a dynamic binary translator allows a target binary to be executed transparently on a host machine having a different computer architecture than the target machine involves selecting a minimum set of target machine states for simulation at run-time. A series of target machine instructions from the target binary is translated into a series of host machine instructions. During translation, a plurality of check points are inserted into the series of host machine instructions. During translation, a plurality of verification points are inserted into the series of host machine instructions. The series of host machine instructions, including the check points and verification points, are executed. Execution of a check point determines a simulated target machine state. Execution of a verification point sends information pertaining to simulated target machine states to an external verifier.