The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Mar. 31, 2010
Shashidhar Rajashekara, Sammamish, WA (US);
Roshan Khan, Seattle, WA (US);
KE Xue, Woodinville, WA (US);
Palani Sundaramurthy, Kirkland, WA (US);
G. Eric Engstrom, Kirkland, WA (US);
Evan R. Stavrou, Seattle, WA (US);
Shashidhar Rajashekara, Sammamish, WA (US);
Roshan Khan, Seattle, WA (US);
Ke Xue, Woodinville, WA (US);
Palani Sundaramurthy, Kirkland, WA (US);
G. Eric Engstrom, Kirkland, WA (US);
Evan R. Stavrou, Seattle, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Software in an electronic device can be tested using a combination of random testing and deterministic testing. In various embodiments, deterministic tests can run for a prescribed duration and/or a prescribed number of iterations before and/or after random testing. Test results can be weighted using a metric representing an amount of code that was stressed during testing. This metric can be determined by tracking software code that is loaded into memory during testing.