The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Jan. 19, 2005
Taulu Sami, Helsinki, FI;
Kajola Matti, Helsinki, FI;
Simola Juha, Helsinki, FI;
Elekta AB, , SE;
Abstract
The present invention relates to a novel manner of measuring DC fields using a multi-channel MEG or MKG measuring instrument; and on the other hand, to a manner of eliminating from the measurement result the interference signals caused by the DC currents. The invention combines the monitoring system of a testee's movement and the method for motion correction of the measured signals so that the signals produced by the DC currents of a moving testee's are visible in the final measurement result as a static signal component in a conventional MEG or MKG measurement. In that case, in the measurement, it is not necessary to beforehand prepare oneself for measuring the DC fields.