The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2012

Filed:

Mar. 25, 2010
Applicants:

Ashok Veeraraghavan, North Cambridge, MA (US);

Oncel C. Tuzel, Cambridge, MA (US);

Aswin Sankaranarayanan, Houston, TX (US);

Amit K Agrawal, Somerville, MA (US);

Inventors:

Ashok Veeraraghavan, North Cambridge, MA (US);

Oncel C. Tuzel, Cambridge, MA (US);

Aswin Sankaranarayanan, Houston, TX (US);

Amit K Agrawal, Somerville, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A point correspondence procedure is applied to a set of images of a specular object to produce sparse reflection correspondences. The set of images is subject to rotation while acquired by a camera. That is, either the camera, the environment or the object rotates. Either a linear system AΘ=0 is solved or a related second order cone program (SOCP) is solved, where Θ is a vector of local surface parameters. Gradients of the surface are obtained from the local quadric surface parameters, and the gradients are integrated to obtain normals, wherein the normals define a shape of the surface.


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