The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Oct. 29, 2008
Bill Faulkner, Waterloo, CA;
Dmitri Eidenzon, Waterloo, CA;
Bill Faulkner, Waterloo, CA;
Dmitri Eidenzon, Waterloo, CA;
RDM Corporation, Ontario, CA;
Abstract
A plurality of PCS values are determined for a document having an area of interest containing critical data and a background image. Reflectance values distributed across the document are obtained and PCS threshold values corresponding to a plurality of locations on the document are stored in memory. Respective PCS values of a plurality of target portions of the surface are determined, each respective PCS value based on a reflectance value of the corresponding target portion and a reflectance value of a corresponding region located adjacent to the target portion, each of the regions being different for each target portion, each PCS value assigned a location representative of the location of the target portion, the size of the region being greater than the size of the target portion. The stored PCS threshold values are compared with the calculated PCS values to determine the acceptability of the background image.