The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Feb. 20, 2008
Kyeongho Lee, Seoul, KR;
Joonbae Park, Seoul, KR;
Jeong Woo Lee, Seoul, KR;
Seung-wook Lee, Seoul, KR;
Eal Wan Lee, Seoul, KR;
Kyeongho Lee, Seoul, KR;
Joonbae Park, Seoul, KR;
Jeong Woo Lee, Seoul, KR;
Seung-Wook Lee, Seoul, KR;
Eal Wan Lee, Seoul, KR;
GCT Semiconductor, Inc., San Jose, CA (US);
Abstract
The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.