The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Sep. 17, 2008
Jong Hyeon Park, San Jose, CA (US);
Allert Van Zelst, Woerden, NL;
Brian Clarke Banister, San Diego, CA (US);
Je Woo Kim, Cupertino, CA (US);
Matthias Brehler, Boulder, CO (US);
Vincent K. Jones, Iv, Redwood City, CA (US);
Jong Hyeon Park, San Jose, CA (US);
Allert van Zelst, Woerden, NL;
Brian Clarke Banister, San Diego, CA (US);
Je Woo Kim, Cupertino, CA (US);
Matthias Brehler, Boulder, CO (US);
Vincent K. Jones, IV, Redwood City, CA (US);
Qualcomm Incorporated, San Diego, CA (US);
Abstract
A 'post-squaring' detection algorithm, and related devices, that may reduce the complexity of maximum likelihood detection (MLD) schemes while preserving their performance is provided. Rather than search for optimum metrics (such as minimum distance metrics) based on squared norm values, a search may be based on un-squared norm metrics, and the squaring may be postponed, for example, until subsequent log-likelihood ratio (LLR) computation. For certain embodiments, approximations of un-squared norm values may significantly reduce computation complexity.