The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Sep. 18, 2008
Helmut Lippert, Jena, DE;
Benno Radt, Jena, DE;
Christian Dietrich, Jena, DE;
Christopher Power, Jena, DE;
Helmut Lippert, Jena, DE;
Benno Radt, Jena, DE;
Christian Dietrich, Jena, DE;
Christopher Power, Jena, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
The invention relates to methods for positioning at least one preferably biological specimen in the specimen space of a microscope arrangement, and to devices for carrying out these methods. Methods and devices are proposed, wherein the specimen's orientation relative to a detection objective's optical axis can be repeatedly changed and, in doing so, the specimen is held so that a substantially unobstructed view of the specimen is ensured from every detection direction. In different constructional variants, the specimen is held at a supporting device by adhesive forces or by a flowing medium, the specimen is held at a capillary opening by capillary action, or at least one specimen is embedded in a body of transparent gel, and the gel body is fixed in the specimen space by means of a rotatable holding device, and the detection direction is changed by rotating the holding device by a given angle of rotation.