The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Nov. 27, 2009
Rongsheng Tian, Santa Clara, CA (US);
Yong Tian, Cupertino, CA (US);
Rongsheng Tian, Santa Clara, CA (US);
Yong Tian, Cupertino, CA (US);
Other;
Abstract
The Field Testing Instrument (FTI) is designed for use in the regular maintenance and installation of airport Precision Approach Path Indicator (PAPI). The FTI is a self-contained and portable instrument that accurately measures the most important PAPI parameters, such as vertical aiming angle, transition angle, and light intensity. In addition to working with the current incandescent PAPIs, the FTI also measures parameters specific to the next generation LED PAPI. The FTI uses modern, efficient technology to reduce the life-cycle cost of approach lighting systems. The FTI improves on traditional PAPI testing methods by directly measuring the PAPI light beam focused to a target plate, as if seen from the pilot perspective. Due to significantly improvements in measurement accuracy and reliability, the FTI may supplement and even replace costly flight checks for PAPI maintenance with ground based operation.