The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Dec. 28, 2006
Cheng-yung Teng, Taipei County, TW;
Yi-chang Hsu, Taipei County, TW;
Wei-fen Chiang, Taipei, TW;
Jack Lin, Yilan County, TW;
Li-ying Chang, Taipei County, TW;
Cheng-Yung Teng, Taipei County, TW;
Yi-Chang Hsu, Taipei County, TW;
Wei-Fen Chiang, Taipei, TW;
Jack Lin, Yilan County, TW;
Li-Ying Chang, Taipei County, TW;
Princeton Technology Corporation, Xindian Dist., New Taipei, TW;
Abstract
The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output signal generated from the device under test to generate a filtered signal. The amplifying circuit amplifies the filtered signal to generate an amplified signal. The comparing module compares the amplified signal with at least one reference level to generate at least one result signal accordingly. The result-examining module examines the result signal to determine a test result for the device under test.