The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2012

Filed:

Jan. 15, 2007
Applicants:

Takashi Maekawa, Kanagawa, JP;

Yasunori Matsumoto, Mie, JP;

Ken Namiki, Kanagawa, JP;

Inventors:

Takashi Maekawa, Kanagawa, JP;

Yasunori Matsumoto, Mie, JP;

Ken Namiki, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 15/00 (2011.01); G06T 11/20 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

An initial polygon obtained from a point group is used as a control polygon, and a control point of the control polygon is offset in a normal direction by the shortest distance from a limit surface generated by the control polygon, so that the position of new control point is determined to allow a subdivision surface to interpolate the initial polygon, thereby generating the subdivision surface which interpolates the point group. A first process to determine the point on the subdivision surface at the shortest distance from each control point, and a second process to move and offset the control point in the normal direction from the surface by the distance between the point on the surface and the initial control point, are iterated until the distance between the initial point group and the point on the surface satisfies the threshold or becomes smaller than the threshold, thereby generating the subdivision surface interpolating the initial polygon. Consequently, the subdivision surface interpolating the point group is generated within a short operation time period, without solving a linear system.


Find Patent Forward Citations

Maekawa, Takashi. (2012). Interpolation processing method, interpolation processing device, shape evaluation method, and shape evaluation device (U.S. Patent No. 8228329). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8228329

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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