The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Mar. 12, 2010
Yosuke Iwasaki, Chiba, JP;
Masashi Kawasaki, Sendai, JP;
Tomoteru Fukumura, Sendai, JP;
JFE Mineral Company, Ltd., Tokyo, JP;
Tohoku University, Sendai-Shi, Miyagi, JP;
Abstract
Provided is a method of evaluating properties of ferrite which can continuously measure change in magnetic properties accompanying change in composition of the ferrite merely by preparing one specimen. A composition gradient ferrite thin film constituted of a plurality of composition gradient ferrite layers which are formed by inclining component composition in the horizontal direction is formed on a single crystal substrate having light transmitting property using a thin film forming method, and a magneto-optical effect is continuously measured along the composition gradient direction of the ferrite thin film whereby change in magnetic properties accompanying a change in composition of the ferrite is continuously measured also provided is a method of evaluating properties of ferrite which can continuously measure change in magnetic properties accompanying change in composition of the ferrite merely by preparing one specimen.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile