The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
May. 28, 2008
Akira Nishimizu, Tokai, JP;
Hirofumi Ouchi, Hitachi, JP;
Yoshio Nonaka, Hitachi, JP;
Yosuke Takatori, Hitachi, JP;
Akihiro Taki, Hitachi, JP;
Makoto Senoo, Tokai, JP;
Akira Nishimizu, Tokai, JP;
Hirofumi Ouchi, Hitachi, JP;
Yoshio Nonaka, Hitachi, JP;
Yosuke Takatori, Hitachi, JP;
Akihiro Taki, Hitachi, JP;
Makoto Senoo, Tokai, JP;
Hitachi-GE Nuclear Energy, Ltd., Ibaraki, JP;
Abstract
Disclosed is an eddy current flaw detection probe that is capable of pressing itself against an inspection target whose curvature varies. A flaw sensor is configured by fastening a plurality of coils to a flexible substrate that faces the surface of the inspection target. A first elastic body is positioned opposite the inspection target for the flaw sensor, is obtained by stacking two or more elastic plates, and has an elastic coefficient that varies in a longitudinal direction. A second elastic body is a porous body positioned between the flexible substrate and the first elastic body. A pressure section is employed to press the first elastic body toward the inspection target.