The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Sep. 17, 2009
Hongguo Zhu, Meriden, CT (US);
Ramkumar Venkataraman, Middletown, CT (US);
Wilhelm Mueller, Meriden, CT (US);
Joseph Lamontagne, Cheshire, CT (US);
Frazier Bronson, Branford, CT (US);
Hongguo Zhu, Meriden, CT (US);
Ramkumar Venkataraman, Middletown, CT (US);
Wilhelm Mueller, Meriden, CT (US);
Joseph Lamontagne, Cheshire, CT (US);
Frazier Bronson, Branford, CT (US);
Canberra Industries, Inc., Meriden, CT (US);
Abstract
A method, system, and software for calculating the true coincidence summing effects for radionuclide spectroscopy analysis. A set of equations which can be implemented with a stored computer program performs calculations to correct the spectroscopic analysis data for gamma-gamma coincidence events, gamma-X-ray coincidence events, as well as gamma-annihilation photon coincidence events. The net gamma-ray, KX-ray and annihilation photon summing-out probabilities for the analytic gamma-ray is the total summing-out probability from all gamma-ray summing-out chains subtracted by the total summing-out probability from all gamma-ray sub-cascade chains involving the analytic gamma-ray. A total efficiency calculation is performed to eliminate the need for using radioactive sources to create summing specific calibration measurements and for increased accuracy.