The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2012
Filed:
Jul. 27, 2010
Keigo Yokoyama, Honjo, JP;
Tadao Endo, Honjo, JP;
Toshio Kameshima, Kumagaya, JP;
Masayoshi Akiyama, Kumagaya, JP;
Tomoyuki Yagi, Honjo, JP;
Katsuro Takenaka, Honjo, JP;
Sho Sato, Honjo, JP;
Keigo Yokoyama, Honjo, JP;
Tadao Endo, Honjo, JP;
Toshio Kameshima, Kumagaya, JP;
Masayoshi Akiyama, Kumagaya, JP;
Tomoyuki Yagi, Honjo, JP;
Katsuro Takenaka, Honjo, JP;
Sho Sato, Honjo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An imaging apparatus includes a detector, having a plurality of pixels arranged in a matrix, for performing first and second radiography operations, a bias light source, and a control unit that controls the operation of the detector and the bias light source. In the first radiography operation, image data corresponding to radiation in a first radiation field corresponding to some of the pixels is output. In the second radiography operation, image data corresponding to radiation in a second radiation field larger than the first radiation field is output. In accordance with a change from the first radiation field to the second radiation field, the operation of the bias light source is controlled so that the irradiation with the bias light is performed during a period between the first and second radiography operations at a bias-light integral dose determined based on radiation integral dose information in the first radiography operation.