The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2012

Filed:

Jun. 23, 2008
Applicants:

Juan Yguerabide, La Jolla, CA (US);

Evangelina E. Yguerabide, La Jolla, CA (US);

David E. Kohne, La Jolla, CA (US);

Jeffrey T. Jackson, Poway, CA (US);

Inventors:

Juan Yguerabide, La Jolla, CA (US);

Evangelina E. Yguerabide, La Jolla, CA (US);

David E. Kohne, La Jolla, CA (US);

Jeffrey T. Jackson, Poway, CA (US);

Assignee:

Invitrogen Corporation, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/551 (2006.01); G01N 33/553 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for specific detection of one or more analytes in a sample. The method includes specifically associating any one or more analytes in the sample with a scattered-light detectable particle, illuminating any particle associated with the analytes with light under conditions which produce scattered light from the particle and in which light scattered from one or more particles can be detected by a human eye with less than 500 times magnification and without electronic amplification. The method also includes detecting the light scattered by any such particles under those conditions as a measure of the presence of the analytes.


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