The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Mar. 13, 2007
Lewis S. Bruck, Redmond, WA (US);
Ranjani Ramamurthy, Bellevue, WA (US);
Tao Di, Newcastle, WA (US);
Shriram Lakshmi, Redmond, WA (US);
Lewis S. Bruck, Redmond, WA (US);
Ranjani Ramamurthy, Bellevue, WA (US);
Tao Di, Newcastle, WA (US);
Shriram Lakshmi, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
In a method for testing a system, the technology initially accesses a database having a plurality of stand-alone pieces-of-code. Each piece-of-code includes a sequence of operations to be performed on a system. One or more of a plurality of stand-alone pieces-of-code within a database are selected to generate a set of at least two stand-alone pieces-of-code, based on a testing scenario. A variable test sequence from a set of at least two stand-alone pieces-of-code is then generated. The variable test sequence is then utilized to test a system based on a testing scenario.