The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
May. 09, 2002
Christopher K Sutton, Everett, WA (US);
Christopher K Sutton, Everett, WA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A hierarchical test executive system comprising and including Procedure, Test, Measurement and Datapoint levels. A Procedure is an ordered list of Tests; a Test is a group of Measurements in a Procedure that share the same test algorithm, and thus the same software code; a Measurement is a configuration or setup for a Test, and provides parameters to a Test; and a Datapoint is a subset of a Measurement containing additional parameters that select a result when one Measurement generates multiple results. When initiated, the test executive system presents a list of models and the user selects a model to be tested. The program then uploads the test software corresponding to the selected model and presents a list and descriptions of Procedures to the user. The user selects one of the Procedures, and the program retrieves the selected procedure from the test software and expands it into Tests, Measurements and Datapoints as determined by the Procedure. The test executive system then loops through the Tests, Measurements and Datapoints, generating the results and a corresponding data structure on the fly.