The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2012

Filed:

Dec. 29, 2004
Applicants:

Philip L. Bohannon, Bridgewater, NJ (US);

Wenfei Fan, Somerset, NJ (US);

Michael E. Flaster, Tenafly, NJ (US);

Rajeev Rastogi, New Providence, NJ (US);

Inventors:

Philip L. Bohannon, Bridgewater, NJ (US);

Wenfei Fan, Somerset, NJ (US);

Michael E. Flaster, Tenafly, NJ (US);

Rajeev Rastogi, New Providence, NJ (US);

Assignee:

Alcatel Lucent, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are provided for identifying constraint violation repairs in data that is comprised of a plurality of records, where each record has a plurality of cells. A database is processed, based on a plurality of constraints that data in the database must satisfy. At least one constraint violation to be resolved is identified based on a cost of repair and the corresponding records to be resolved and equivalent cells are identified in the data that violate the identified at least one constraint violation. A value for each of the equivalent cells can optionally be determined, and the determined value can be assigned to each of the equivalent cells. The at least one constraint violation selected for resolution may be, for example, the constraint violation with a lowest cost. The cost of repairing a constraint is based on a distance metric between the attributes values.


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