The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Jun. 20, 2006
Yohei Hasegawa, Tokyo, JP;
Masayoshi Kobayashi, Tokyo, JP;
Yohei Hasegawa, Tokyo, JP;
Masayoshi Kobayashi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A quality degradation point estimating method for estimating a quality degradation point in a directed link set through which a communication flow passed is provided. The quality degradation point estimating method has: (A) determining a test flow set for estimating a quality degradation point; and (B) estimating the quality degradation point in the directed link set by sending the test flow set to the network. The (A) step includes a step of setting the flow, which passes through a partial set as a part of the directed link set, as the test flow and adding the set test flow to the test flow set. The test flow is sent from the test terminal on the network to a predetermined node in the partial set. A response is obtained at the predetermined node, and the response is sent from the predetermined node to a predetermined terminal.