The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2012

Filed:

Jul. 27, 2009
Applicants:

N Hari Kumar, Chennai, IN;

J Mohamed Zahoor, Chennai, IN;

Inventors:

N Hari Kumar, Chennai, IN;

J Mohamed Zahoor, Chennai, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an iterative method and an apparatus for distribution-independent detection of intermediate outliers and outliers in the distribution tail of streamed data. A considerable sequence of streamed data is sequentially read and subsequently assigned to matching bins. The bins are adaptively allocated when, where and if they are needed. Each bin range expands concurrently with the distribution range of the accumulating items assigned to the bin, adding a margin. For every N'th read item, overlapping or adjoining bins are merged, whereupon the bins are assessed for insider preclusion. Information regarding outliers is extracted from the remaining outlier bins when the entire data sequence has been processed.


Find Patent Forward Citations

Loading…