The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Oct. 27, 2010
Applicants:
James M. Carrick, San Diego, CA (US);
Mark R. Kennedy, Madison, CT (US);
Jeffrey D. Chismar, Plymouth, MN (US);
Inventors:
James M. Carrick, San Diego, CA (US);
Mark R. Kennedy, Madison, CT (US);
Jeffrey D. Chismar, Plymouth, MN (US);
Assignee:
Gen-Probe Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract
System for quantifying analyte polynucleotides employs computer-implemented analysis of real-time amplification data using a calibration curve defined by parametric equations.
Carrick, James. (2012). Parametric system for quantifying analyte polynucleotides (U.S. Patent No. 8224584). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8224584
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile