The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
May. 31, 2010
Danlei Chu, North Vancouver, CA;
Cristian Gheorghe, North Vancouver, CA;
Johan Backstrom, North Vancouver, CA;
Danlei Chu, North Vancouver, CA;
Cristian Gheorghe, North Vancouver, CA;
Johan Backstrom, North Vancouver, CA;
Honeywell ASCa Inc., Mississauga, CA;
Abstract
Alignment is a critical component for modeling a cross-directional (CD) papermaking process. It specifies the spatial relationship between individual CD actuators to paper quality measurements. Misalignment can occur unexpectedly due to sheet wander or CD shrinkage variation. In certain applications and circumstances, a misalignment of one third (⅓) actuator zone width can result in significant paper quality degradation. Detecting a misalignment and identifying CD alignment in closed loop are highly demanded in paper mills but these are nontrivial problems. A technique for maintaining proper CD alignment in sheetmaking systems entails monitoring the alignment online, triggering closed loop identification if misalignment is detected, and then deploying the new alignment. No personnel intervention is required.