The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Jun. 15, 2007
Morteza Safai, Seattle, WA (US);
Gary E. Georgeson, Federal Way, WA (US);
Talion Edwards, Foristell, MO (US);
John W. Finlayson, Renton, WA (US);
Morteza Safai, Seattle, WA (US);
Gary E. Georgeson, Federal Way, WA (US);
Talion Edwards, Foristell, MO (US);
John W. Finlayson, Renton, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Exemplary systems and methods are provided for imaging a unit under test. Orientation of an imaging system is determined with a machine vision system, a unit under test is scanned with the imaging system, and the scanned image is processed into a substantially distortion-free image. The scanned image may be processed into a substantially distortion-free image by mapping a scanned image to coordinates determined by the machine vision system. By combining the position and orientation information collected at the time each image pixel is collected, the image can be assembled without distortion by mapping a detector signal to the appropriate image coordinate. Alternately, the scanned image may be processed into a substantially distortion-free image by mapping a scanned image to a predetermined matrix grid of coordinates, identifying distortion in the scanned image, and correcting identified distortion in the scanned image.