The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2012

Filed:

Jun. 08, 2009
Applicants:

Peter Mccandlish, Rochester, NY (US);

Xing LI, Webster, NY (US);

Ryan Metcalfe, Marion, NY (US);

Barbara Farrell, Ontario, NY (US);

Inventors:

Peter McCandlish, Rochester, NY (US);

Xing Li, Webster, NY (US);

Ryan Metcalfe, Marion, NY (US);

Barbara Farrell, Ontario, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein is a method for detecting thin lines in image data. The method is performed by a processor to process contone image data. The processing includes thresholding a window of pixels using a first set of thresholds established in the contone domain, and then counting and thresholding the binary pixels using a second set of thresholds. The processing in the contone and binary domain are used to determine if a thin line exists and if a pixel of interest in the window is an edge pixel that is part of a thin line. The disclosed method produces better quality output images and reduces the addition of false lines in an image.


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