The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Nov. 25, 2008
Takashi Magara, Kanagawa-ken, JP;
Takashi Magara, Kanagawa-ken, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
An appearance inspection apparatus, wherein an image inspection result based on a result of image-taking and image-analyzing a product to be inspected can be displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected is provided. An appearance inspection method includes: performing image inspection of a product to be inspected by image-taking the product to be inspected and image-analyzing the product to be inspected in an image-treating section. An inspector is capable of inspecting the product to be inspected with an eye in the state that a result of the image inspection is displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected.