The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Sep. 14, 2009
Abdelaziz Bouzegzi, Grenoble, FR;
Pierre Jallon, Grenoble, FR;
Philippe Ciblat, Paris, FR;
Abstract
The present invention relates to a method for the blind estimation of at least one parameter of an OFDM signal by maximizing an objective function depending on said parameter. The objective function implements a parameterized model of the OFDM modulation and a matched filtering corresponding to that model. The OFDM signal, baseband demodulated and then sampled in an observation window, is the object of the adapted filtering to calculate the objective function. It is also proposed to include, in the parameterized model, the temporal offset between the observation window and an OFDM symbol as well as the frequency offset between the frequency of the OFDM signal carrier and the baseband demodulation frequency.